アノード溶解したニッケル薄膜の表面フラクタル次元

抄録

Quantitative characterization of surfaces of anodic dissolved nickel films was performed using the roughness exponent, the Hurst rescaled range analysis and the Fourier transform of their AFM images. Of three methods, the first and second methods give almost the same fractal dimension 2.06 and 2.02 respectively, which indicate the roughness exponent α interchanged with the Hurst exponent, but the third method determines a little larger fractal dimension 2.25. The value of the fractal dimension, 2.0, implies that the anodic dissolved nickel films surface have no fractal structure.