2000 年 66 巻 644 号 p. 1097-1101
A smart structure using piezoelectric devices electrically shunted by an inductor-resistor circuit was tested for passive microvibration control of an aluminum beam of a 1010×60×30Tmm size simply supported at both ends. The piezoelectric devices were attached to the beam on the top and bottom surfaces at the middle point of it. It is known that such devices with a shunted circuit work like a dynamic vibration absorber. For the piezoelectric devices, 8d33 stack type devices of a 10×10×20Hmm size, and 2d31 type devices of a 60×60×5T mm size were tested, showing almost the same performance. Through the tests, it was confirmed that the smart structure could effectively suppress microvibration of the beam in a high frequency, and the smart structure could be applied to microvibration control of precision equipment.