抄録
Two different optical methods for the determination of particle size distributions in the nanometer range are described. One method uses the scattering of polarized light at different angles and applies a regularized inversion algorithm and is applicable for arbitrary materials. In the other method, light-absorbing particles are heated by a short laser pulse up to evaporation temperature, and the temperature of the particles is determined by the measurement of the thermal radiation. This method has been applied since many years; the detailed analysis, however, shows that one has to be careful with interpretation of the measured data.
