Abstract
A new total internal reflection (TIR) Raman microscope that can be used for adhesion testing based on the Johnson-Kendall-Roberts (JKR) theory was developed. The angle and the focus of the laser beam can be accurately controlled by observing the image of the laser spot on a CCD camera in the spectrometer. As a result, strong Raman signals were obtained. It was observed that the depolarization ratio of polymer brushes changes with the compressive force. This equipment is useful for the analysis of the interface and the anisotropic structure of polymer thin films.
