熊本高等専門学校研究紀要
Online ISSN : 2189-8553
Print ISSN : 1884-6734
ISSN-L : 1884-6734
シリコン添加による酸化ガリウム膜の電気光学特性への影響とX線光電子分光スペクトル評価
高倉 健一郎角田 功大山 英典竹内 大輔中島 敏之高尾 周一郎村上 克也山本 博康
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研究報告書・技術報告書 フリー

2010 年 2 巻 p. 89-92

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A transparent electrode of Si doped B-Ga2O3 films for solar cells, flat panel displays and other devices, which consist in chemically abundant and ecological elements of gallium and oxygen, were grown on quarts or silicon substrate by RF magnetron sputtering using sintered Ga2O3 and Si target. Unfortunately, the conductivity of Si doped B-Ga2O3 film does not increase by Si doping. However, the B-Ga2O3 energy gap increases with increasing Si concentration in the deposited film. From X-ray photoelectron spectroscopy (XPS) measurement, peaks correlated with oxygen, gallium and silicon are observed. The Io/IGa XPS peak ratio decreases with increasing Si concentration. It could be said that the oxidation of gallium became weaken with Si doping.
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