Abstract
Effects of Ar and Ne diluents on the output power of Xecl lasers are experimentally studied for the Xe CI lasers transversely excited byashort-pulse (40 ns) electron-beam. We used many gas mixtures: Ar, Ar/HCl, Ar/F2, Ne, Ne/HCl and N2, to precisely measure the electron-beam energy deposited into the laser gas mixtures. According to the measurement, it is verified that the deposition energy measured in a pure rare-gas and a mixture of rare-gas and halogen gas gives always less energy than the value converted from the energy deposited in the pure N2, because of the considerable spontaneous emission loss in the related rare-gas mixtures. The value converted from the N2 is found rather correct. For a 2-atm mixture of Ar, Xe, and HCl pumped with an excitation rate of 0.95MW/cm3 ·atm, the intrinsic efficiency is 3.3%, while it is 2.5% for a 3-atm mixture of Ne, Xe, and HCI pumped with a rate of 0.60MW/cm3 ·atm.
