二次イオン質量分析法(SIMS)によるOrchard　Leavesの定量分析

抄録

A thermodynamic approach to quantitative analysis proposed by Andersen was applied to NBS standard reference material Orchard Leaves. The electrical charge accumu lated at the sample surface under the primary ion bombardment was neutralized with the method which utilizes effectively secondary electrons as described in the previous paper. In order to decrease the contributions of the organic molecular ions and their fragment ions to the peaks of elemental ions, the analysis was performed by using high power density primary ion beam. Agreement of the quantitative analytical values with the chemical analysis was satisfactory as well as the case of the metal analysis.