抄録
This paper discusses the analysis of particles of sintering furnance dusts using SIMS (Secondary ion mass spectrometry) techniques.
In-depth profile of elements of the single particle was corrected by total secondary ion monitoring method. As a result of this method high amounts of Ca, Al, Na, Si, K and Co were detected on the surface of a particle.
The results obtained by depth profile analysis revealed that elements in the particles are grouped into three clsses; 1) enriched at the surface 2) poor at the surface and enriched inside, 3) homogeneous from the surface to inside.
Quantitative analysis of particles was carried out by relative secondary ionization efficiency which was obtained using same matrix sample. Obtained values for such elements as Ca, Mg, Mn and V in the particles were most same as those of bulk concentrations.
