Grain Boundary Structure and Solute Segregation in CuO Doped 3 mol% Yttria Stabilized Zirconia

Tetsuhiko Onda; S. J. Lloyd; Hisayuki Suematsu; Hisao Yamauchi; A. L. Greer; Keiji Kurashima; Yoshio Bando; Motozo Hayakawa

doi:10.2320/matertrans.42.145

Tetsuhiko Onda, S. J. Lloyd, Hisayuki Suematsu, Hisao Yamauchi, A. L. Greer, Keiji Kurashima, Yoshio Bando, Motozo Hayakawa

Author information

Keywords: yttria-stabilized zirconia, copper doped, grain boundary structure, grain boundary segregation, amorphous phase, high resolution electron microscopy, energy dispersive X-ray spectroscopy, electron energy-loss spectroscopy

JOURNAL FREE ACCESS

2001 Volume 42 Issue 1 Pages 145-150

DOI https://doi.org/10.2320/matertrans.42.145

Details

Abstract

The microstructure of the grain boundaries and solute segregation are studied for 0.3 mol%CuO doped 3 mol% yttria-stabilized zirconia (3Y-TZP) using TEMs equipped with EDS and EELS . The observations revealed grain boundaries of various thickness ranging from a sharp boundary without any extra phase to those with amorphous-like phase, of up to 2 nm thickness in between. There were also pockets filled with amorphous-like phase at the triple junctions of grain boundaries. Segregation of Cu and Y were observed not only in these amorphous-like regions but also along sharp grain boundaries without any extra phase.

Corresponding author

Register with J-STAGE for free!