MATERIALS TRANSACTIONS
Online ISSN : 1347-5320
Print ISSN : 1345-9678
ISSN-L : 1345-9678
TEM Observation of Dislocation Emission from a Crack at DBTT in Si
SuprijadiHiroyasu Saka
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2001 Volume 42 Issue 1 Pages 28-32

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Abstract

Emission of dislocations from a crack which propagated at the ductile-brittle transition temperature (DBTT) in Si was observed by combined use of focused-ion beam (FIB) technique and transmission electron microscopy (TEM). At the wake of a DBTT crack many dislocation lines and dislocation loops were observed, while a wake of a precrack introduced at room temperature, no dislocations were observed. In addition, those glide dislocation lines which are emitted at the DBTT crack are smoothly curved, indicating that they can overcome easily the Peierls stress.

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© 2001 The Japan Institute of Metals and Materials
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