2001 Volume 42 Issue 10 Pages 2071-2074
The ion-electron structure factor estimated from the anomalous X-ray scattering measurements near the Se K absorption edge has been used in the reverse Monte Carlo (RMC) simulation for determining the valence electron density distribution in amorphous Se. The results clearly indicate that the origin of particular valence electron distribution for Se can be explained by two non-bonding electrons and two bonding electrons.