MATERIALS TRANSACTIONS
Online ISSN : 1347-5320
Print ISSN : 1345-9678
Electron Density Distribution in Amorphous Se Determined by Reverse Monte Carlo Simulation Coupled with Anomalous X-ray Scattering Data
Masatoshi SaitoYoshio Waseda
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2001 Volume 42 Issue 10 Pages 2071-2074

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Abstract

The ion-electron structure factor estimated from the anomalous X-ray scattering measurements near the Se K absorption edge has been used in the reverse Monte Carlo (RMC) simulation for determining the valence electron density distribution in amorphous Se. The results clearly indicate that the origin of particular valence electron distribution for Se can be explained by two non-bonding electrons and two bonding electrons.

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© 2001 The Japan Institute of Metals and Materials
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