MATERIALS TRANSACTIONS
Online ISSN : 1347-5320
Print ISSN : 1345-9678
Images of Scanning Tunneling Microscopy on the Si(001)-p(2× 2) Reconstructed Surface
Yoshitaka FujimotoHiromi OkadaKatsuyoshi EndoTomoya OnoShigeru TsukamotoKikuji Hirose
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2001 Volume 42 Issue 11 Pages 2247-2252

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Abstract

We have investigated in detail the dependence of scanning tunneling microscopy (STM) images of the Si(001)-p(2×2) surface on bias and tip-sample distance, based on first-principles molecular-dynamics simulations. STM images on the terrace of the Si(001)-p(2×2) surface are found to be similar to those at the SA-step edges of the Si(001) surface. The present theoretical calculations predict that the STM images strongly depend on the sample bias and tip-sample separations, and that the π and π surface states contribute to the changes of the STM corrugation images.

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© 2001 The Japan Institute of Metals and Materials
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