2002 Volume 43 Issue 9 Pages 2354-2356
Yttria-partially-stabilized zirconia (YPSZ) films were synthesized on Hastelloy-XR as thermal barrier coatings (TBC) at a high deposition rate of 100 \\micron h−1 (2.8×10−8 ms−1) by metal-organic chemical vapor deposition (MOCVD) using Zr(dpm)4 and Y(dpm)3 precursors. The deposition rate of 100 \\micron h−1 was the highest among the reported values for YPSZ films by CVD . The YPSZ films were columnar morphology and (200) oriented with a tetragonal structure.