X-ray Diffraction Analysis of the Recrystallization Behavior of SiC_w/Al Composite at High Temperature

Abstract

By using the method of in-situ X-ray diffraction and profile analysis, the variation of grain size and microstrain of the cold-rolled SiC_w/Al composite at high temperature was measured, and the recrystallization behavior of the composite was investigated. Test results showed that the activation energy of grain growth after recrystallization and recovery at higher temperature of matrix in composite is close to the activation energy for self-diffusion of pure Al. It was verified that the recovery phenomenon was accompanied with the grain growth, and the whiskers cannot affect the grain growth and recovery of matrix in composite at higher temperature.