2007 Volume 48 Issue 3 Pages 471-475
The oxidation characteristics of nickel thin films were investigated by atomic force microscopy (AFM) anodization. The anodization parameters, such as anodized voltages, oxidation times, pulse voltage periods and how they affected the creation and growth of the oxide nanostructures were explored. The results showed that the height of the nickel oxide nanodots grew as a result of either the anodization time or the anodized voltage being increased. The oxide growth rate was dependent on the anodized voltage and on the resulting electric field strength. Furthermore, as the electric field strength was at an order of 2×109 Vm−1, the anodization rate decreased quickly and the oxide dots stopped growing.