MATERIALS TRANSACTIONS
Online ISSN : 1347-5320
Print ISSN : 1345-9678
High-Resolution Transmission Electron Microscopy Observation of Liquid-Phase Bonded Aluminum/Sapphire Interfaces
Christine Marie MontesaNaoya ShibataSi-Young ChoiHiroshi TonomuraKazuhiro AkiyamaYoshirou KuromitsuYuichi Ikuhara
Author information
JOURNALS FREE ACCESS

2009 Volume 50 Issue 5 Pages 1037-1040

Details
Abstract

In this paper, we characterized aluminum/sapphire interface structure by using high-resolution transmission electron microscopy. It was found that step structures of sapphire formed at the aluminum/sapphire interfaces during the liquid-phase bonding. It was discovered that the addition of silicon in aluminum significantly reduces the step growth at the interface. Silicon was found to segregate and precipitate at the interface. These results suggest that the strong preference of silicon at the interface may inhibit the step growth reactions during liquid-phase bonding.

Information related to the author
© 2009 The Japan Institute of Metals and Materials
Previous article Next article
feedback
Top