MATERIALS TRANSACTIONS
Online ISSN : 1347-5320
Print ISSN : 1345-9678
Simultaneous Atomic Imaging of Atomic Force Microscopy and Scanning Tunneling Microscopy Using Metal Coated Cantilevers
Daisuke SawadaAkira HiraiYoshiaki SugimotoMasayuki AbeSeizo Morita
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2009 Volume 50 Issue 5 Pages 940-942

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Abstract

Imaging of surface atoms with simultaneous measurement of noncontact atomic force microscopy (NC-AFM) and scanning tunneling microscopy (STM) is performed. Si cantilever coated with PtIr provides stable AFM/STM operations to obtain high spatial resolution images. AFM/STM measurements on Si(111)-(7×7), Ge(111)-c(2×8), and TiO2(110) surfaces are presented at room temperature. On the Ge(111)-c(2×8) surface, adatom and restatom sites which have the same atomic patterns are determined from dual bias AFM/STM measurements.

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© 2009 The Japan Institute of Metals and Materials
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