2010 Volume 51 Issue 9 Pages 1516-1520
Electron backscatter diffraction in conjunction with scanning electron microscopy is used to assess local misorientation. However, measurement errors cause the distribution of misorientation to be scattered. To reduce the errors in local misorientation identification and obtain a smooth map, a data processing procedure is proposed. By taking the average of the crystal orientation of surrounding points, the distribution of the local misorientation became smoother and clearer. Moreover, the obtained local misorientation was shown to be valid for quantitatively evaluating the degree of plastic strain induced in Type 316 stainless steel.
