Abstract
The accumulation and distribution of electron-induced secondary electrons around epoxy resin are studied using electron holography. The distribution of secondary electrons is determined to be sensitive to the surface conditions of the epoxy resin, particularly to the presence of conductive materials on the surface that are introduced during specimen preparation processes. These results provide a deeper understanding of the charging and discharging mechanisms for epoxy resin, and the behavior of secondary electrons around these materials. This study also provides a new perspective for the visualization of various forms of electron behavior around insulating materials such as epoxy resin through the control of their surface characteristics.
Fig. 4 (a) Hologram of Y-shaped epoxy resin. (b) Reconstructed phase image of epoxy resin treated with FIB. (c) Estimated electric potential distribution on the specimen surface. (d) Simulated phase image of epoxy resin for the image shown in (b). (e) Simulated phase image without consideration of the modulation of the phase shift of the reference wave.
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