Development of a Suppression Technique of Potential-Induced Degradation by a Formation of Glass Layer in Si PV Modules

抄録

Shunt-type potential-induced degradation (PID) is one of the degradation phenomena of photovoltaic (PV) modules which degrade PV performance drastically in short time compared to other degradation modes. In this paper, a new suppression technique of the PID was developed by coating a glass layer (GL) on the top or bottom surface of cover glass using a chemical solution known as liquid glass. PID tests were conducted using PV modules prepared with and without GL. A clear suppression effects of the PID were observed by forming GL, and the occurrence of the PID was delayed about 4 times by the formation of GL on the bottom side of cover glass in PV modules.