MATERIALS TRANSACTIONS
Online ISSN : 1347-5320
Print ISSN : 1345-9678
ISSN-L : 1345-9678

This article has now been updated. Please use the final version.

Advanced Electron Microscopy for Materials Science
Zentaro AkaseMitsuaki HigoKeiko ShimadaTakafumi SatoHideyuki MagaraDaisuke ShindoNobuhiko Ohno
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JOURNAL FREE ACCESS Advance online publication

Article ID: MT-M2021086

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Abstract

This paper presents current research trends in advanced electron microscopy techniques for materials science. The survey is based on the special issue of Materials Transactions published in October 2019 (Vol. 60, No. 10). Advanced electron microscopy has been applied extensively to characterize various materials. The recent development and extension of analyses of electric fields and the collective motions of secondary electrons by in situ electron holography are discussed in detail.

Fig. 4 (a) Reconstructed phase image of ultramicrotomed epoxy resin. (b) Reconstructed amplitude image of resin. (c) Reconstructed phase image of FIB processed resin. (d) Reconstructed amplitude image of FIB processed resin.19) Fullsize Image
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