Advanced Electron Microscopy for Materials Science

Zentaro Akase; Mitsuaki Higo; Keiko Shimada; Takafumi Sato; Hideyuki Magara; Daisuke Shindo; Nobuhiko Ohno

doi:10.2320/matertrans.MT-M2021086

This article has now been updated. Please use the final version.

Advanced Electron Microscopy for Materials Science

Zentaro Akase, Mitsuaki Higo, Keiko Shimada, Takafumi Sato, Hideyuki Magara, Daisuke Shindo, Nobuhiko Ohno

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Keywords: electron holography, dynamical diffraction, in situ experiment, electric field, secondary electron

JOURNAL FREE ACCESS Advance online publication

Article ID: MT-M2021086

DOI https://doi.org/10.2320/matertrans.MT-M2021086

The final version of this article is now available: Vol. 62 (2021), No. 10 pp. 1589-1595

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Abstract

This paper presents current research trends in advanced electron microscopy techniques for materials science. The survey is based on the special issue of Materials Transactions published in October 2019 (Vol. 60, No. 10). Advanced electron microscopy has been applied extensively to characterize various materials. The recent development and extension of analyses of electric fields and the collective motions of secondary electrons by in situ electron holography are discussed in detail.

Fig. 4 (a) Reconstructed phase image of ultramicrotomed epoxy resin. (b) Reconstructed amplitude image of resin. (c) Reconstructed phase image of FIB processed resin. (d) Reconstructed amplitude image of FIB processed resin.¹⁹⁾ Fullsize Image

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