Proceedings of Microelectronics Symposium
Online ISSN : 2434-396X
MES2013
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Host: Japan Institute of Electronics Packaging

MES2013
A study on decision method for thermal boundary condition and life of Power Device
*[in Japanese], [in Japanese], [in Japanese]
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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 25-28

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© 2013 The Japan Institute of Electronics Packaging
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