Proceedings of Microelectronics Symposium
Online ISSN : 2434-396X
MES2018
Conference information

Host: Japan Institute of Electronics Packaging

MES2018
Detectability of Resistive Open Defects in Assembled PCB Circuits by Boundary Scan Testing after Shipping to a Market
*[in Japanese], [in Japanese], [in Japanese], [in Japanese]
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Pages 185-188

Details
Download PDF (563K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Article 1st page
Content from these authors
© 2018 The Japan Institute of Electronics Packaging
Previous article Next article
Favorites & Alerts

Recently viewed articles
Share this page
feedback
 Top