抄録
When the characteristic curve of a phosphor plate is obtained, the fading effect should be considered. In the case that numerous data are taken on a phosphor plate using the time-scale method and/or the distance-changing method, it is difficult to correct the fading effect. Therefore, we have developed a new experimental apparatus which can measure the characteristic curve in a short period of time using only a single exposure. The apparatus consists of a shielded box having one longitudinal slit on the front face and a plate-type shield having six transverse slits with different ranges (multi-slits) . The multi-slits can be moved within a range of 400 mm with a velocity of 200 mm/s. The phosphor plate is set in the back face of the shielded box and X-rays are irradiated with the box through the moving multi-slits. As a result, six measured areas, which are irradiated for different times, are obtained on the phosphor plate, and the characteristic curve is determined by the single irradiation. In this paper, using diagnostic X-ray equipment, we demonstrate that the proper characteristic curves can be measured for tube voltages of 40 kV to 100 kV.
