Zero-dark-counting X-ray-spectrum measurement using a cerium-doped yttrium aluminum perovskite crystal and a multipixel photon counter with changes in the pixel number

抄録

To measure X-ray spectra with high count rates, we developed a detector consisting of a cerium-doped yttrium aluminum perovskite [YAP (Ce) ] crystal with a decay time of 30 ns and a multipixel photon counter (MPPC) . The photocurrents flowing through the MPPC are converted into voltages and amplified by a high-speed current-voltage amplifier, and 200-ns-width event pulses from the amplifier are sent to a multichannel analyzer (MCA) to measure X-ray spectra. We used three MPPCs of 100, 400 and 1,600pixels/mm², and the MPPCs were driven under pre-Geiger mode at a temperature of 23℃. At a tube voltage of 100kV and a tube current of 5.0μA, the maximum count rate was 6.0 kilo-counts per second using a 400-pixel YAP (Ce) -MPPC detector.