Reflection Multiple Beam Wedge Plate Shear Interferometry for Lens Testing

Rajpal S. SIROHI; Tomoaki EIJU; Kiyofumi MATSUDA; Thomas H. BARNES

doi:10.1007/BF03254889

Rajpal S. SIROHI, Tomoaki EIJU, Kiyofumi MATSUDA, Thomas H. BARNES

著者情報

キーワード: lens lateral aberration, shear-interferometry, lens testing, multiple interference

ジャーナルフリー

1994 年 1 巻 2 号 p. 293-295

DOI https://doi.org/10.1007/BF03254889

詳細

抄録

It is shown that a multiple beam wedge plate shear interferometry can be used to represent the lateral aberration curve of a lens more accurately. For larger shear, some new artifacts appear in the interferogram which have been explained by considering contributions of higher order terms in the Taylor's series expansion of the path function.

責任著者(Corresponding author)

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