Numerical Method to Fit the Refractive Index Profile of Planar Microlenses Made by Ion Exchange Techniques

Eva ACOSTA; Susana RÍOS; Masahiro OIKAWA; Akimitsu SATO; Kenichi IGA

doi:10.1007/s10043-996-0227-y

Eva ACOSTA, Susana RÍOS, Masahiro OIKAWA, Akimitsu SATO, Kenichi IGA

著者情報

キーワード: planar microlenses, 3-D distributed index profile, shearing interferometry, ion exchange techniques

ジャーナルフリー

1996 年 3 巻 4 号 p. 227-231

DOI https://doi.org/10.1007/s10043-996-0227-y

詳細

抄録

We present a fitting method for obtaining a functional form of the refractive index profile of planar microlenses made by ion exchange techniques from total shearing interferometric measurements. Compared to the usual power series expansion fit, this method allows a reduction in the number of coefficients needed to characterize a lens.

責任著者(Corresponding author)

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