Automatic Deformation Analysis in Electronic Speckle Pattern

抄録

We propose a new fringe analysis method that uses only one speckle interferogram of a deformed object to obtain phase change distribution by deformation. This method uses cos^-1 operations to extract absolute, not signed, values of new phase after deformation. Considering the phase changes in a small local area, true phase changes retain almost the same value by assuming a continuous deformation in the area. This retention determines the sign of the new phase. From the new phase and the initial phase, the phase change distribution by the deformation can be obtained. Experimental results show the usefulness of this method.