Two Beam Collection Mode Photon Scanning Tunneling Microscope

Tetsuya KAWANISHI; Kouichiro TAMADA; Masao KITANO

doi:10.1007/s10043-997-0601-4

Tetsuya KAWANISHI, Kouichiro TAMADA, Masao KITANO

著者情報

キーワード: photon scanning tunneling microscope, evanescent wave, inclination of surface, deformation of image, near field

ジャーナルフリー

1997 年 4 巻 5 号 p. 601-604

DOI https://doi.org/10.1007/s10043-997-0601-4

詳細

抄録

We studied the image deformation due to the surface inclination of objects in photon scanning tunneling microscopes (PSTM). A novel collection mode PSTM with two light sources is proposed to reduce the deformation and experimental results show that the PSTM system is effective.

責任著者(Corresponding author)

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