抄録
Structure of thin oriented films of silver of thicknesses from 20 to 300 Å, produced by con-densation on cleaved surfaces of single crystals of NaCI, was examined by means of electron-microscopy and diffraction. When examined by an electron microscope, the general feature of the films was similar to that of the non-oriented. However, characteristic images due to definite orientation of crystallites in the films were also found, such as streaks parallel to [110]Ag-direc-tion, the extinction contours (Fig. 3), and the rectangular holes appearing in some films when corroded with aqueous solution of NaCI.
The structure were clearly shown to be affected by the amount of residual gas during con-densation of silver in evaporating apparatus. A possible explanation for the result is proposed.
