1958 年 27 巻 3 号 p. 162-167
Method for determining the interference color of thin films using an automatic relay computer is studied. Numerical calculations involved in determining the interference color are performed more conveniently by taking the wavenumber as variable rather than the wavelength if the change of refractive index with wavelength is neglected.
The C.I.E. colorimetric data on Eλxλ, Eλyλ, Eλzλ, are transformed into a table using the wavenumber as variable at 200cm-1 intervals. A table for wavenumbers extending from. 13, 000cm-1 to 27, 000cm-1 is given.
Using this method, the interference color of stained lens surface coated with anti-reflecting film is determined. The results are shown plotted on the C.I.E. chromaticity diagram.