抄録
The diffraction pattern of an arbitrary single aberration is evaluated when the aberration func-tion is expressed by the circle polynomials as
alnmσ2l+mRnm(r)cosmφ.
In this paper, it is shown that the diffraction pattern in general either with one single aberration term or with several aberration terms can be integrated if the aberration function is expressed in the form of
Σclnmσ2l+mrncosmφ.
The intensity decrease at the Gaussian image point due to aberration is calculated and the importance of the amount of this decrease is explained.
