偏光解析による表面と薄膜の研究
1965 年 34 巻 11 号 p. 782-794
詳細
1965 年 34 巻 11 号 p. 782-794
After describing briefly the principle and techniques of ellipsometry, the authors review the recent developments in ellipsometric studies of films and surfaces with comments on future possibilities. The items covered are: determination of optical constants, observation of transition layers, adsorption studies, work on oxidation and corrosion of solid surfaces, and others.
