1969 年 38 巻 12 号 p. 1139-1140
This report describes a procedure for the corr-ection of observed Bragg angles, when a misali-gnment exists between diffractometer and x-ray focus. It consists of, recording directly the incide-nt x-ray beam on the diffractometer, reading out its misalignment on the 2θ-scale of the diffracto-meter, and then making an estimate of correction of observed Bragg angles. A formula for the correction is given, which was verified by its application to Debye-Scherrerlines of Si powders.