会議名: 第23回バイオメディカル・ファジィ・システム学会
回次: 23
開催地: 北九州
開催日: 2010/10 -
In designing electron microscope, it is necessary to estimate the effect of the electromagnetic interaction between electrons within the range of the electron beam. To perform this estimation, we considered forces between parallel electric currents in two models. First, we calculated the current in a conductor line containing both a static positive charge and a dynamic negative charge. This model is very similar to a real current. Second, we considered the current which is generated by only the movement of a positive charge. In both cases, we thought about the effect of special relativity on the forces. The first case resulted in an attractive force, as would be expected. However, The latter case resulted in a repulsive force.