X-Ray Spectra from Neon-like Tungsten Ions in the Interaction with Electrons

Hirofumi WATANABE; Nobuyuki NAKAMURA; Daiji KATO; Tomohide NAKANO; Shunsuke OHTANI

doi:10.1585/pfr.2.027

Rapid Communications

X-Ray Spectra from Neon-like Tungsten Ions in the Interaction with Electrons

Hirofumi WATANABE, Nobuyuki NAKAMURA, Daiji KATO, Tomohide NAKANO, Shunsuke OHTANI

著者情報

キーワード: dielectronic recombination, electron beam ion trap (EBIT), resonant process, Ne-like tungsten ion, radiative electron capture

ジャーナルフリー

2007 年 2 巻 p. 027

DOI https://doi.org/10.1585/pfr.2.027

詳細

抄録

X-ray spectra from highly charged tungsten ions have been observed in the interaction with an electron beam at energies ranging from 14 to 1.5 keV by using an electron beam ion trap (EBIT). In this energy range, resonant x-ray transitions at around 9 keV predominantly take place through dielectronic recombination processes. The measured spectra were compared with the theoretical calculation with the Hebrew University Lawrence Livermore Atomic Code (HULLAC).

責任著者(Corresponding author)

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