1965 年 28 巻 4 号 p. 188-194
Silver contents in every steps of processed photo film were determined continuously by fluorescent X-ray analysis, using a newly deviced film auto-moving apparatus.
Setting the apparatus in sample chamber of X-ray spectrometer (Rigaku electric work, K-5), we get Log E and Silver content relation curve of processed photo-film within 20 minutes.
In X-ray intensity determination, fixed 2θ method was used but we can't find any differenciation compared with usual peak method.
By using our method, silver analysis time was extremely shortened and precision of the method was about ±2 % or less in films containing 25-60 mg silver per 100cm2 area.