Journal of Photopolymer Science and Technology
Online ISSN : 1349-6336
Print ISSN : 0914-9244
ISSN-L : 0914-9244
Preparation of Thin Dielectric Films by Plasma-Assisted Chemical Vapor Deposition of Hexamethyldisilazane
Yu IriyamaKazuki NagaseYuichi HasegawaTatsuhiko Ihara
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1999 Volume 12 Issue 1 Pages 39-44

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Abstract

Hexamethyldisilazane (HMDS) was subjected to plasma-assisted chemical vapor deposition (PCVD) for the formation of thin dielectric films on Al substrates for the use as a dielectric electrode in clinical bioelectric measurements. From the measurement of X-ray photoelectron spectroscopy, the PCVD film deposited at higher temperature was found to contain less amount of carbon and tend to approach silicon-nitride-like film. Dielectric loss, tanδ, of the PCVD films deposited on rough Al foil was too large, but it was small enough for the film on a smooth Al plate. The PCVD film deposited at 350°C on Al plate was found to have the greatest dielectric constant, εs, as well as the greatest mechanical strength and adhesivity. In the measurement of dielectric properties with a physiological salt solution on the PCVD film as an electrode, the PCVD films showed an excellent barrier property. A possibility for the application to clinical bioelectric measurements was suggested.

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© The Technical Association of Photopolymers, Japan
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