Journal of Photopolymer Science and Technology
Online ISSN : 1349-6336
Print ISSN : 0914-9244
ISSN-L : 0914-9244
Sensitized Transparent Photobase Additive For 193nm Lithography
Munirathna PadmanabanJun-Born BaeMichelle CookWoo-Kyu KimAxel Klauck-JacobsTakanori KudoM. Dalil RahmanRalph R DammelJeffrey D. Byers
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2000 Volume 13 Issue 4 Pages 617-624

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Abstract

This paper reports on the use of trimethyl sulfonium hydroxide as a base additive for 193nm applications, which is found to stabilize the latent image as well as act as a photodecomposable base. Delay time stability (exposure to post-exposure bake) of formulations consisting of trimethylsulfonium hydroxide is compared to that of a non-photodecomposable base (diethanolamine) in both methacrylate- and cycloolefin-based 193nm resists. Resist formulations made using the trimethylsulfonium base were delay-stable for more than one hour, while the reference formulation with diethanolamine showed T-top formation within 10 minutes delay time under the same conditions. The trialkylsulfonium hydroxide base additives were found to be photodecomposable by measuring the acid produced upon exposure. Compared to a non-photodecomposable base containing resist, the photodecomposable base containing resist produced more acid in the exposed areas under identical PAG/BASE molar ratios.

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© The Technical Association of Photopolymers, Japan
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