Proceedings of IIAE Annual Conference
Online ISSN : 2424-211X
2018
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CoC Bonding Technology with Al-Si/TiN Bumps for Narrow Pitch Bonding
*Masahiro Akiyama*Takahiro Mitsuishi*Dali Zhang*Myung-Jae Lee*Edoardo Charbon
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CONFERENCE PROCEEDINGS OPEN ACCESS

Pages 47-48

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[in Japanese]
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© 2018 The Institute of Industrial Applications Engineers
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