Proceedings of JSPE Semestrial Meeting
2008 JSPE Autumn Conference
Session ID : C36
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Host: The Japan Society for Precision Engineering

[title in Japanese]
*Toru Takegawa, Yu Watanabe, Yasuhiko Arai, Shunsuke Yokozeki
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Keywords: Multi camera, Electronic speckle pattern interferometry, Dynamic deformation measurement, Optimization of measurement condition
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[in Japanese]
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© 2008 The Japan Society for Precision Engineering
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