Proceedings of JSPE Semestrial Meeting
2009 JSPE Spring Conference
Session ID : K36
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Host: The Japan Society for Precision Engineering

Accurate interferometric length measurement with a pair of frequency scanning VCSELs
*Seiichi Kakuma, Yasuhiko Katase
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Keywords: VCSEL, Frequency scanning, Interferometry
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[in Japanese]
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© 2009 The Japan Society for Precision Engineering
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