Proceedings of JSPE Semestrial Meeting
2011 JSPE Spring Conference
Session ID : K31
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Host: The Japan Society for Precision Engineering

Super-Resolution Optical Inspection for Semiconductor Defects Using Infrared Evanescent Standing Wave
*Ryota Kudo, Satoru Takahashi, Kiyoshi Takamasu
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Keywords: defect inspection, super-resolution optics, standing wave illumination, infrared light, evanescent light
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[in Japanese]
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© 2011 The Japan Society for Precision Engineering
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