Proceedings of JSPE Semestrial Meeting
2011 JSPE Spring Conference
Session ID : K32
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Outlier Detection of Confocal Microscopy utilizing Reflected Light Intensity Distribution
*Seiichiro HaraRyoma KishimotoKazuyuki Sasajima
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CONFERENCE PROCEEDINGS FREE ACCESS

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[in Japanese]
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© 2011 The Japan Society for Precision Engineering
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