Proceedings of JSPE Semestrial Meeting
2011 JSPE Spring Conference
Session ID : K33
Conference information

Host: The Japan Society for Precision Engineering

[title in Japanese]
*Takayuki Kurihara, Ryuichi Sugimoto, Ryota Kudo, Satoru Takahashi, Kiyoshi Takamasu
Author information
Keywords: Evanescent field, Height measurement, Penetration depth, TIRF microscopy, Intelligent measurement, Super resolution
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Download PDF (702K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Abstract
[in Japanese]
Content from these authors
© 2011 The Japan Society for Precision Engineering
Previous article Next article
Favorites & Alerts

Recently viewed articles
Share this page
feedback
 Top