Straightness profile measurement by sequential two-point method utilizing a laterally sifting reference plate

Proceedings of JSPE Semestrial Meeting

2012 JSPE Spring Conference

Session ID : F14

DOI https://doi.org/10.11522/pscjspe.2012S.0.437.0

Conference information

Host: The Japan Society for Precision Engineering

Straightness profile measurement by sequential two-point method utilizing a laterally sifting reference plate

*Naoyuki Ito, Kazuhito Togawa, Satoshi Kiyono, Kazuhisa Yanagi, Mamoru Hara

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Keywords: Straightness profile, Two-point method, Flat surface, Software-datum

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Abstract

[in Japanese]

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© 2012 The Japan Society for Precision Engineering

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