Optimum Wavelength Selection for the Three-Wavelength Interferometry

Abstract

This paper presents a novel method for selecting optimum measurement wavelengths in multi-wavelength interferometry. It is based on a coincidence error analysis in exact fractions solutions. By this method, three wavelengths of 470, 560, and 600 nm were selected. With these wavelengths, an extended measurement range of 8 microns was experimentally proved.