Proceedings of JSPE Semestrial Meeting
2016 JSPE Spring Conference
Session ID : T68
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Host: The Japan Society for Precision Engineering

Phase sensitive CT measurement using a pixelated polarizing shearing interferometer
*David Serrano, Yukitoshi Otani
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Keywords: Interferometry, Phase Shifting Technique, Polarization
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Abstract
A lateral shear interferometer using polarizing pixelated camera is implemented. By obtaining measurements at different angles of rotation a 3D distribution of a static sample can be obtained.
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© 2016 The Japan Society for Precision Engineering
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