Proceedings of JSPE Semestrial Meeting
2016 JSPE Spring Conference
Session ID : T69
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Cylinder fitting from a sinogram image for dimensional CT metrology
*Lin XueHiromasa SuzukiYutaka Ohtake
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Abstract
In industry, dimensional metrology requires micron-level measurement accuracy. However, it is very difficult to achieve with X-ray computed tomography (CT) due to various artefacts. In order to avoid the influences of these artefacts, this paper proposes a new method for measuring cylinder that is a common geometric structure in mechanical parts. The proposed method fits dimensional parameters of cylinder (radius, unit vector of central axis, one point on central axis) from a sinogram image directly. In the new method, as CT reconstruction is excluded, cone beam artefact, beam hardening artefact, etc. can be avoided, resulting in an improved measurement accuracy. The performance of the method is evaluated by use of simulation data.
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© 2016 The Japan Society for Precision Engineering
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