Published: March 01, 2016Received: December 04, 2015Released on J-STAGE: September 02, 2016Accepted: January 07, 2016
Advance online publication: -
Revised: December 04, 2015
This report proposes a new method to three-dimensionally track each single nano-particle that has been interacting with a surface in nanoscale processing phenomena by using dual wavelength of evanescent field.